LTA-1200
Category
Polishing and GrindingOverview
This product is effective in evaluating contamination and defects in ultra-thin SOI / epi / bulk wafers and polysilicon layers. Lifetime is an important parameter that sensitively reflects contamination and crystal defects mixed in the sample.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found