Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.Documents
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Verified
CATEGORY
Packaging
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74446
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / ISMECA
NX32
CATEGORY
Packaging
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
74446
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Ismeca NX32 is a versatile and scalable 32-position turret handler designed for efficient testing and inspection of integrated circuits, LEDs, and discrete devices. This system offers multiple configurations to handle various types of devices: it can handle wafers in film-frame for input and/or output, commonly used for LEDs and wafer-level package (WLP) devices; tray and tube input and/or output, suitable for integrated circuits and discretes; and bowl feeding, tape and de-taping, alignment, laser marking, inspection, and test modules. The NX32 is capable of testing devices at both ambient and hot temperatures, providing flexibility for diverse testing requirements.Documents
No documents