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ASMPT / DEK SUNBIRD
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    sophisticated system providing total solution on sorting, six-side inspection and flexibility for an individual unit testing and laser marking. Applications include wafer level packages / dice inspection comprising micro crack inspection at six sides and sorting according to wafer mapping generated from the upstream processes.
    Documents

    No documents

    ASMPT / DEK

    SUNBIRD

    verified-listing-icon

    Verified

    CATEGORY
    Packaging

    Last Verified: 19 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    146071

    Wafer Sizes:

    Unknown

    Vintage:

    2022

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ASMPT / DEK SUNBIRD

    ASMPT / DEK

    SUNBIRD

    Packaging
    Vintage: 2022Condition: Used
    Last Verified19 days ago

    ASMPT / DEK

    SUNBIRD

    verified-listing-icon
    Verified
    CATEGORY
    Packaging
    Last Verified: 19 days ago
    listing-photo-0478cb8fcf234ca5be6b0b832d457f3f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/0478cb8fcf234ca5be6b0b832d457f3f/3a5a765d4bab4b7282af697db8386e9b_cb3df872d4a74dc5b3c777f79e643e811201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    146071

    Wafer Sizes:

    Unknown

    Vintage:

    2022

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    sophisticated system providing total solution on sorting, six-side inspection and flexibility for an individual unit testing and laser marking. Applications include wafer level packages / dice inspection comprising micro crack inspection at six sides and sorting according to wafer mapping generated from the upstream processes.
    Documents

    No documents

    Similar Listings
    View All
    ASMPT / DEK SUNBIRD

    ASMPT / DEK

    SUNBIRD

    PackagingVintage: 2022Condition: UsedLast Verified:19 days ago