Description
No descriptionConfiguration
No ConfigurationOEM Model Description
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.Documents
No documents
Verified
CATEGORY
Overlay
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
128990
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
PROVE
CATEGORY
Overlay
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
128990
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.Documents
No documents