Skip to main content
Moov logo
Moov Icon
ASML YieldStar 1375F
    Description
    Overlay Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.
    Documents

    No documents

    ASML

    YieldStar 1375F

    verified-listing-icon

    Verified

    CATEGORY
    Overlay

    Last Verified: 19 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    147631

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ASML YieldStar 1375F

    ASML

    YieldStar 1375F

    Overlay
    Vintage: 0Condition: Used
    Last Verified19 days ago

    ASML

    YieldStar 1375F

    verified-listing-icon
    Verified
    CATEGORY
    Overlay
    Last Verified: 19 days ago
    listing-photo-6da0f8db9b354f0aac2e0ff10bf2ced9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    147631

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Overlay Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The YieldStar 1375F delivers nanometer-level overlay and CD measurements based on diffraction from chip structures themselves or small targets placed within the chip design.
    Documents

    No documents

    Similar Listings
    View All
    ASML YieldStar 1375F

    ASML

    YieldStar 1375F

    OverlayVintage: 0Condition: UsedLast Verified:19 days ago