Description
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.Configuration
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM Model Description
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Verified
CATEGORY
Overlay
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled / Crated
Product ID:
132024
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ASML
YieldStar S-200B
CATEGORY
Overlay
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled / Crated
Product ID:
132024
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.Configuration
The YieldStar S-200B is an optical overlay metrology system used for fast, high-precision measurement of overlay deviations on 300 mm wafers – typically in post-etch monitoring for production process control as a stand-alone system.OEM Model Description
None ProvidedDocuments
No documents