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Description
Atomic Force Microscope (AFM)Configuration
No ConfigurationOEM Model Description
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.Documents
No documents
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115141
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
VEECO / DIGITAL INSTRUMENTS
DIMENSION 3100
CATEGORY
Microscope
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115141
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Atomic Force Microscope (AFM)Configuration
No ConfigurationOEM Model Description
The Dimension 3100 Scanning Probe Microscope (SPM) is a high-resolution imaging device that produces three-dimensional images of a sample surface. The microscope works by scanning a sharp tip, mounted on a flexible cantilever, over the sample surface. The cantilever is attached to one end of a cylindrical piezoelectric tube, which is mounted near the top of the microscope. By applying voltages to the X, Y, and Z electrodes on the piezoelectric tube, the tube can be deflected horizontally and vertically to produce a precise raster scan over the sample surface. A stepper motor translates a slide with the sample attached, while a separate motor drive controls the height of the microscope and tip relative to the sample surface. This allows for accurate and detailed imaging of the sample surface.Documents
No documents