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NIKON NEXIV VMR-10080
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.
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    NIKON

    NEXIV VMR-10080

    verified-listing-icon

    Verified

    CATEGORY
    Microscope

    Last Verified: 4 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    156811

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    NIKON NEXIV VMR-10080

    NIKON

    NEXIV VMR-10080

    Microscope
    Vintage: 0Condition: Used
    Last Verified4 days ago

    NIKON

    NEXIV VMR-10080

    verified-listing-icon
    Verified
    CATEGORY
    Microscope
    Last Verified: 4 days ago
    listing-photo-d608a28a8eb341e4ac74850c4a458ef4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/78401/d608a28a8eb341e4ac74850c4a458ef4/ed8b56e6eab242d8a97065fe48182e18_image20261030223851745_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    156811

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Long 1000 x 800 mm stage stroke provides maximum performance in the measurement of large-size workpieces such as FPD devices. Printing masks for substrates. Mother substrates for PCBs. Shadow masks. FPD devices. Long stage stroke enables measurements of LCD substrates/modules and large-size PCBs. Laser AF also enables measurements of height gaps and warping in workpieces. Search function enables measurements of lands and holes of PCBs. Variety of illumination choices facilitate accurate edge detection even for vague geometries. High-speed stage and high-speed image processing provide high throughput.
    Documents

    No documents

    Similar Listings
    View All
    NIKON NEXIV VMR-10080

    NIKON

    NEXIV VMR-10080

    MicroscopeVintage: 0Condition: UsedLast Verified:4 days ago