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WYKO / VEECO SP 3200
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    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
    OEM Model Description
    None Provided
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    WYKO / VEECO

    SP 3200

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    Verified

    CATEGORY

    Profiler
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    21924

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    WYKO / VEECO

    SP 3200

    verified-listing-icon

    Verified

    CATEGORY

    Profiler
    Last Verified: Over 60 days ago
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/YnzC35xvfQtPT0qgi8jFbMkRBHwfnGVhFpvpzUNHIB4_20190301_114727_f
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    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/hw9uowZxeXCV7yxBD2P1BICPQNBrCuZ4prTS2Bjp-yQ_20190301_114727_f
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    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    21924

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
    OEM Model Description
    None Provided
    Documents

    No documents

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