We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More
SpectraShape 9000
Category
MetrologyOverview
The SpectraShape 9000 utilizes an array of optical technologies and a new high intensity light source to characterize and monitor the critical dimension (CD) and shapes of 3-D transistors, memory cells and other complex features used in high-performance IC devices.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- No products found