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KLA FLX 2320
    Description
    Stress Measurement TDCS
    Configuration
    Thin film stress measure
    OEM Model Description
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
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    No documents

    KLA

    FLX 2320

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Idle


    Product ID:

    93187


    Wafer Sizes:

    Unknown


    Vintage:

    2000

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    KLA FLX 2320

    KLA

    FLX 2320

    Metrology
    Vintage: 1992Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    FLX 2320

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 30 days ago
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/2339566eaad64bb2b46dcb30d4cb99cb_be5471a7adf2451c98b3faf25bffc5911201a_mw.jpeg
    listing-photo-70bbb97f5d4e4212b001c5ce11597236-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/70bbb97f5d4e4212b001c5ce11597236/68e04aabc2c84fb8acd38e369209c834_8c92b5ba79004de8acc731c4aedfa6bc1201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Idle


    Product ID:

    93187


    Wafer Sizes:

    Unknown


    Vintage:

    2000


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Stress Measurement TDCS
    Configuration
    Thin film stress measure
    OEM Model Description
    The Tencor FLX-2320 is an equipment that accurately measures film stress at temperatures from -65°C to 500°C, using dual wavelength technology to work on all types of films, including transparent ones like silicon nitride. This helps better understand film properties in simulated process environments.
    Documents

    No documents

    Similar Listings
    View All
    KLA FLX 2320

    KLA

    FLX 2320

    MetrologyVintage: 1992Condition: UsedLast Verified: Over 60 days ago
    KLA FLX 2320

    KLA

    FLX 2320

    MetrologyVintage: 1993Condition: UsedLast Verified: 10 days ago