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KLA / ADE WAFERSIGHT
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    Documents

    No documents

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    73906

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology
    Vintage: 2005Condition: Used
    Last Verified3 days ago
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-88bc9cd9c570484fac90f8569b99338a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/88bc9cd9c570484fac90f8569b99338a/b5d5c22adade46318e6cae000cc8d5f6_b27c1c549be745089d82b87626b75a1145005c_mw.jpeg
    listing-photo-88bc9cd9c570484fac90f8569b99338a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/88bc9cd9c570484fac90f8569b99338a/40ff9479c3ab42838e3280dd856f901a_5650c7e0488a4df6993e2ce913a7fa8e45005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    73906

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    Documents

    No documents

    Similar Listings
    View All
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    MetrologyVintage: 2005Condition: UsedLast Verified:3 days ago
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    MetrologyVintage: 0Condition: UsedLast Verified:Over 60 days ago