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KLA / ADE WAFERSIGHT
    Description
    No description
    Configuration
    PHASE SHIFT
    OEM Model Description
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    Documents

    No documents

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: 3 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104683


    Wafer Sizes:

    Unknown


    Vintage:

    2005


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    Metrology
    Vintage: 2005Condition: Used
    Last Verified3 days ago

    KLA / ADE

    WAFERSIGHT

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: 3 days ago
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/d628b30a219b4c3c9d5641f208610282_20241119111832950_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/bac75782d80443bea9fb9c22cb03dc86_2024111911183295007_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/eeb14414f6354e3dbe3d1fe6fba9ff10_2024111911183295011_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/4492f866b2c646f1a581d535dc53a0f7_2024111911183295008_mw.jpg
    listing-photo-792385eda15b42ccbc4881cd24e311ce-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74913/792385eda15b42ccbc4881cd24e311ce/fca69f8e5f65493882229e957d7c625b_906ce58dbc2a4cbfb472a6af2a5457a71201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104683


    Wafer Sizes:

    Unknown


    Vintage:

    2005


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    PHASE SHIFT
    OEM Model Description
    A new wafer flatness and shape metrology tool for 300mm and advanced 200mm production, the WaferSight measurement precision allows wafer and device manufacturers to meet ITRS metrology requirements down to the 35nm generation. Utilizing optical technologies, the WaferSight system extends ADE’s market presence in wafer dimensional metrology.
    Documents

    No documents

    Similar Listings
    View All
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    MetrologyVintage: 2005Condition: UsedLast Verified:3 days ago
    KLA / ADE WAFERSIGHT

    KLA / ADE

    WAFERSIGHT

    MetrologyVintage: 0Condition: UsedLast Verified:Over 60 days ago