Used TAKANO / TOPCON WM-2500 Equipment

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WM-2500

Overview

Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm

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TAKANO / TOPCON WM-2500Mask Inspection
Vintage: Condition: Used
Last VerifiedOver 60 days ago
TAKANO / TOPCON WM-2500Mask Inspection
Vintage: Condition: Used
Last VerifiedOver 60 days ago

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WM-2500

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