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RAITH ELPHY Plus
  • RAITH ELPHY Plus
Description
Nanolithography System Controller Pattern generator Laser source Interferometric stage
Configuration
No Configuration
OEM Model Description
Precise and fast – Accelerate your SEM or FIB-SEM ELPHY Plus pattern processor (DSP technology) has been designed with utmost care to deliver unexcelled electronic performance. This is an undeniable prerequisite for nanolithography with ultimate resolution, precision, and stability – specifically when attached to modern thermal-field emission based SEMs with high beam current densities.
Documents

No documents

CATEGORY
Lithography

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

83334


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

RAITH

ELPHY Plus

verified-listing-icon
Verified
CATEGORY
Lithography
Last Verified: Over 60 days ago
listing-photo-d1c382bf1c444a5b95c17b339dec2995-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44451/d1c382bf1c444a5b95c17b339dec2995/4673275a928f47bca69c94c3d483b932_e2895571700b4b1fbfea44d66cf7f188_mw.jpeg
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

83334


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Nanolithography System Controller Pattern generator Laser source Interferometric stage
Configuration
No Configuration
OEM Model Description
Precise and fast – Accelerate your SEM or FIB-SEM ELPHY Plus pattern processor (DSP technology) has been designed with utmost care to deliver unexcelled electronic performance. This is an undeniable prerequisite for nanolithography with ultimate resolution, precision, and stability – specifically when attached to modern thermal-field emission based SEMs with high beam current densities.
Documents

No documents