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Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEM Model Description
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PARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
Verified
CATEGORY
Laser
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
14356
Wafer Sizes:
Unknown
Vintage:
Unknown
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Refurbishment Services
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View AllPARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
Verified
CATEGORY
Laser
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
14356
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEM Model Description
None ProvidedDocuments
No documents