Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Gatan 682 Precision Etching and Coating System (PECS) is a benchtop instrument designed for the preparation of samples for scanning electron microscopy (SEM) and other analytical techniques. It utilizes broad-beam argon ion milling to polish and etch sample surfaces, removing damage and revealing microstructural details. Additionally, the system can sputter-coat samples with conductive materials, such as gold-palladium (Au/Pd), platinum (Pt), chromium (Cr), and carbon (C), to enhance imaging quality and prevent charging during SEM analysis. The PECS allows for both etching and coating processes to be performed on the same sample without breaking vacuum, ensuring sample integrity and efficiency in preparation.Documents
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GATAN (PIPS)
682
Verified
CATEGORY
Ion Milling
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116441
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
GATAN (PIPS)
682
CATEGORY
Ion Milling
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116441
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Gatan 682 Precision Etching and Coating System (PECS) is a benchtop instrument designed for the preparation of samples for scanning electron microscopy (SEM) and other analytical techniques. It utilizes broad-beam argon ion milling to polish and etch sample surfaces, removing damage and revealing microstructural details. Additionally, the system can sputter-coat samples with conductive materials, such as gold-palladium (Au/Pd), platinum (Pt), chromium (Cr), and carbon (C), to enhance imaging quality and prevent charging during SEM analysis. The PECS allows for both etching and coating processes to be performed on the same sample without breaking vacuum, ensuring sample integrity and efficiency in preparation.Documents
No documents