Description
No descriptionConfiguration
Flexible ion beam system, often used with HD2000 STEM (see TSS TEM), Goniometer easy move to HD2000 STEM.OEM Model Description
None ProvidedDocuments
No documents
HITACHI
FB-2000A
Verified
CATEGORY
Inspection Equipment
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
112014
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
FB-2000A
CATEGORY
Inspection Equipment
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
112014
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Flexible ion beam system, often used with HD2000 STEM (see TSS TEM), Goniometer easy move to HD2000 STEM.OEM Model Description
None ProvidedDocuments
No documents