TALOS F200X G2
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Inspection EquipmentOverview
The Talos F200X G2 scanning transmission electron microscope ((S)TEM) delivers the most precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X G2 (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
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