Description
TesterConfiguration
No ConfigurationOEM Model Description
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.Documents
No documents
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
121860
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMO / KEYTEK
ORION3
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
121860
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
TesterConfiguration
No ConfigurationOEM Model Description
The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identification and hardening of sensitive structures prior to full-scale production. Given the extremely high cost of IC production, as well as customer demands for precisely timed component delivery schedules, the Orion3 can save substantial costs in terms of time, material and lost opportunity (time to market). The high resolution dual cameras permit easy and rapid discharge pin alignment during the test setup routine. Both the x and y axis are displayed simultaneously. The cameras may be left on during the test to monitor the pin alignment. Vacuum hold-down enables device testing regardless of device types and sizes.Documents
No documents