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Description
TesterConfiguration
No ConfigurationOEM Model Description
The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.Documents
No documents
PREFERRED
SELLER
CATEGORY
Final Test
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
106665
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
SELLER
TERADYNE
J750EX-HD
CATEGORY
Final Test
Last Verified: Over 60 days ago
Buyer pays 12% premium of final sale price
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
106665
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
TesterConfiguration
No ConfigurationOEM Model Description
The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.Documents
No documents