Description
18 sets of J750 Teradyne Tester Manipulator: ESMOConfiguration
18 functional units of Teradyne J750 Semiconductor Test Platforms Total Quantity: 18 Systems (Complete with Test Head, ESMO Manipulator, Power Supply/Conditioner, and Auto DIB Changers) Pin Configurations: 17 Units: 1024-Pin Configuration 1 Unit: 512-Pin Configuration System Internal Boards: Installed with Channel boards, CTO boards, CUB, and DPS modules Software & OS: IG-XL Version 3.50.40 running on Windows XP SP3 (Offline License) Current Condition: AS IS (Functional machines before decommissioning). 9 Sets: Professionally packed in vacuum-sealed wooden crates. 9 Sets: Currently located in the production area with cold steel condition.OEM Model Description
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.Documents
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TERADYNE
J750
CATEGORY
Final Test
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
147478
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available