Description

No description

Configuration

No Configuration

OEM Model Description

The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.

Documents

No documents

PREFERRED

SELLER

TERADYNE

J750

Verified

Final Test

Last Verified: Over 60 days ago

Buyer pays 12% premium of final sale price

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

104187

Wafer Sizes:

Unknown

Vintage:

Unknown

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

Similar Listings