Description
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The Teradyne IP750 is a high-performance in-circuit test system used for testing printed circuit boards (PCBs) and electronic assemblies. It is widely utilized in the electronics manufacturing industry for functional testing, fault detection, and quality assurance of PCBs. Key features of the IP750 include in-circuit testing (ICT), high-speed testing, multi-site testing, comprehensive test coverage, powerful diagnostics, programmability, flexibility, and integration with manufacturing systems. Teradyne is a leading supplier of automated test equipment, and the IP750 is one of their popular offerings in the field of in-circuit testing.Documents
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TERADYNE
IP750
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
73309
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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Similar Listings
View AllTERADYNE
IP750
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
73309
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Teradyne IP750 is a high-performance in-circuit test system used for testing printed circuit boards (PCBs) and electronic assemblies. It is widely utilized in the electronics manufacturing industry for functional testing, fault detection, and quality assurance of PCBs. Key features of the IP750 include in-circuit testing (ICT), high-speed testing, multi-site testing, comprehensive test coverage, powerful diagnostics, programmability, flexibility, and integration with manufacturing systems. Teradyne is a leading supplier of automated test equipment, and the IP750 is one of their popular offerings in the field of in-circuit testing.Documents
No documents