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Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The J750 HD Probe Tower is an advanced piece of technology designed to keep up with the latest J750 EX and IP750 instrumentation, such as the HOVIS, ICUL, LCD, and future instruments. It increases the physical spring pin count of the standard J750 1024 Pin Tower while providing the same improved electrical performance as the J750 EX Tower. With a total pin count of 5848, compared to the 2992 pins of the standard tower, it represents a 95% increase. This expanded pin count enables multisite testing, allowing for more system resources to be connected to more DUTs. The HD tower retains the same mechanical outlines as the standard prober and uses the same J750 1024 probe card form factor, providing docking interface compatibility. Based on proven spring pin technology, this 300mm probe tower offers unmatched reliability, uptime, and flexibility. It’s an impressive piece of technology that is sure to improve testing capabilities.Documents
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Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
106102
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TERADYNE
J750HD
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
106102
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The J750 HD Probe Tower is an advanced piece of technology designed to keep up with the latest J750 EX and IP750 instrumentation, such as the HOVIS, ICUL, LCD, and future instruments. It increases the physical spring pin count of the standard J750 1024 Pin Tower while providing the same improved electrical performance as the J750 EX Tower. With a total pin count of 5848, compared to the 2992 pins of the standard tower, it represents a 95% increase. This expanded pin count enables multisite testing, allowing for more system resources to be connected to more DUTs. The HD tower retains the same mechanical outlines as the standard prober and uses the same J750 1024 probe card form factor, providing docking interface compatibility. Based on proven spring pin technology, this 300mm probe tower offers unmatched reliability, uptime, and flexibility. It’s an impressive piece of technology that is sure to improve testing capabilities.Documents
No documents