Description
No descriptionConfiguration
Max pin: Max 512pin Test Method: Per-Pin System in asynchronous testing 4 Stations Applicable (4 Handler or 4 Prober) Max 32 Muti site Testing per Station (Can test different devices) VI source baord: Standard: ±30V/±30mA, ±30V/±300mA, ±64V/±320mA High V: ±60V/±2A, ±150V/±30mA, +2000V/±10mA High A: ±30V/±10A, ±60V/±4A, 100A Digital Module (DMU): 50MHz Test Rate 256pins (Max) DSP Module: Digitizer : 100MHz 14bit ets Handler Docking: Head: Direct Handler Docking Cable: Cable Handler DockingOEM Model Description
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SPANDNIX
SX-3030
CATEGORY
Final Test
Last Verified: 20 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137006
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Max pin: Max 512pin Test Method: Per-Pin System in asynchronous testing 4 Stations Applicable (4 Handler or 4 Prober) Max 32 Muti site Testing per Station (Can test different devices) VI source baord: Standard: ±30V/±30mA, ±30V/±300mA, ±64V/±320mA High V: ±60V/±2A, ±150V/±30mA, +2000V/±10mA High A: ±30V/±10A, ±60V/±4A, 100A Digital Module (DMU): 50MHz Test Rate 256pins (Max) DSP Module: Digitizer : 100MHz 14bit ets Handler Docking: Head: Direct Handler Docking Cable: Cable Handler DockingOEM Model Description
None ProvidedDocuments
No documents