Description
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8 parallel, ambient/hotOEM Model Description
The Epson NS8000 IC Test Handler series is designed to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments. It combines significantly improved performance with high throughput. With a contact force of up to 240kgf and blazing transfer, testing and sorting speeds of 13,500 chips per hour, this powerful series offers the ultimate in performance. The NS8000 IC Test Handler series supports wide socket pitches and can test chips at temperatures as high as 155°C.Documents
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SEIKO / EPSON
NS8080
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68680
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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SEIKO / EPSON
NS8080
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68680
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
8 parallel, ambient/hotOEM Model Description
The Epson NS8000 IC Test Handler series is designed to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments. It combines significantly improved performance with high throughput. With a contact force of up to 240kgf and blazing transfer, testing and sorting speeds of 13,500 chips per hour, this powerful series offers the ultimate in performance. The NS8000 IC Test Handler series supports wide socket pitches and can test chips at temperatures as high as 155°C.Documents
No documents