SEIKO / EPSON

NS6040

NS 7000

NS7080

NS 8160LS

The Epson NS8000 IC Test Handler series is designed to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments. It combines significantly improved performance with high throughput. With a contact force of up to 240kgf and blazing transfer, testing and sorting speeds of 13,500 chips per hour, this powerful series offers the ultimate in performance. The NS8000 IC Test Handler series supports wide socket pitches and can test chips at temperatures as high as 155°C.

NS8080

TR-60

NS 8040 

NS 7080W

NS 6000

NS 8080HW

NS 5000

TR55

NS7160W

NS7010

NS-8160MS

Boasting a contact force of up to 240kgf and blazing transfer, testing and sorting speeds of 13,500 chips per hour, this powerful series offers the ultimate in performance. With support for wide socket pitches and temperatures as high as 155°C, the NS8000 IC Test Handler series is the answer to all your testing needs.

NS8000

NS7160

NS 5054

NS 8160W

NS 8080H

8040SH

NS8080W

D TRAN

NS 5040

High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

Up to 8 sites testing capability
Testing area from 184mm x 149mm
Up to 120Kgf contact force
UPH - up to 13,500 (ambient) & 
Up to 8,200 (High Temperature)

NS8080SH

The Epson NS8000 IC Test Handler series is designed to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments. It has up to 8 sites testing capability and a testing area from 264mm x 149mm. The contact force can go up to 240kgf and it can handle up to 13,500 units per hour (ambient) and up to 8,200 units per hour (high temperature).

NS8080MS

IC Test Handler
Up to 32 site testing capability
Testing area from 344mm x 244mm
Up to 480kgf contact force
UPH - up to 20,000 (Ambient) & 
Up to 10,500 (High Temperature)

NX1032XS

G6-651S

NS 5040 F3

SEIKO / EPSON

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NS6040

NS 7000

NS7080

NS 8160LS

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