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TERADYNE / NEXTEST MAVERICK II GT
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Maverick II. Since its introduction in 2001, we have sold over 300 Maverick II test systems. Maverick II doubled Maverick’s test frequency to 133 MHz and provides enhanced performance and accuracy, while retaining all of the advantages of the Maverick architecture. Its expanded performance and feature set make Maverick II a compelling choice for more demanding R&D and manufacturing applications. Maverick II tests a wide range of devices, including flash and other types of memory, logic devices, microcontrollers, smart cards and other SOCs. It is available in four packages—PT, ST, SST and GT—which range in size from 16 to 512 pins.
    Documents

    No documents

    TERADYNE / NEXTEST

    MAVERICK II GT

    verified-listing-icon

    Verified

    CATEGORY
    Final Test

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    42085

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    TERADYNE / NEXTEST MAVERICK II GT

    TERADYNE / NEXTEST

    MAVERICK II GT

    Final Test
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    TERADYNE / NEXTEST

    MAVERICK II GT

    verified-listing-icon
    Verified
    CATEGORY
    Final Test
    Last Verified: Over 60 days ago
    listing-photo-d66dd0ff810b4bfdb20d801d8c2873d9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/9486/d66dd0ff810b4bfdb20d801d8c2873d9/560eed90fbd648c3ba03ec0d4c60f828_7087d9964c334990b2f89f68ed7272b11105c_mw.jpeg
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    listing-photo-d66dd0ff810b4bfdb20d801d8c2873d9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/9486/d66dd0ff810b4bfdb20d801d8c2873d9/0db79ea2fe234843a07c917b0e2c2a79_937251d3cbda415dad9444805bc1722b1105c_mw.jpeg
    listing-photo-d66dd0ff810b4bfdb20d801d8c2873d9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/9486/d66dd0ff810b4bfdb20d801d8c2873d9/914ed4fb3ccb4e9fbf6b786e5323d5ba_75dd7b9f70b14979b3b62ec96ee6b4dc1105c_mw.jpeg
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    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    42085

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Maverick II. Since its introduction in 2001, we have sold over 300 Maverick II test systems. Maverick II doubled Maverick’s test frequency to 133 MHz and provides enhanced performance and accuracy, while retaining all of the advantages of the Maverick architecture. Its expanded performance and feature set make Maverick II a compelling choice for more demanding R&D and manufacturing applications. Maverick II tests a wide range of devices, including flash and other types of memory, logic devices, microcontrollers, smart cards and other SOCs. It is available in four packages—PT, ST, SST and GT—which range in size from 16 to 512 pins.
    Documents

    No documents

    Similar Listings
    View All
    TERADYNE / NEXTEST MAVERICK II GT

    TERADYNE / NEXTEST

    MAVERICK II GT

    Final TestVintage: 0Condition: UsedLast Verified: Over 60 days ago