Description

TestEdge

Configuration

Upgraded D10 to a 2.8GHz CPU and 6GB of memory. 208-240V - 16A 50/60Hz Slots 0-3 DPINs (Digital Channels) Slot 4 DPS16 (Power Supplies) Slots 5 and 6 DMSDIG (Digitizer instrument) Slots 7 and 8 DPINs (Digital Channels Slot 9 DIBU (Device Interface Board Utility)

OEM Model Description

200 Mbps with 96 channels per card. 16 channels at 2A each, 4 quadrant. Audio, video instruments. Compact, scalable, air cooled. Optimized multi-site test architecture. Introduced in fiscal 2005, the Sapphire D extends the key attributes of the Sapphire into a cost effective test platform addressing the more cost driven markets such as personal consumer devices, micro-controllers, digital-baseband and display driver technologies. The Sapphire D architecture is highly configurable and focused on extending scalability into massive multi-site testing, which results in a superior cost of test model for our customers. The Sapphire D leverages electronics integration and air-cooling to produce a compact form factor. The Sapphire D is used for engineering as well as wafer sort and final production testing. Sapphire D initial introductory instruments are the DPIN 96 (96 channels at 200 Mbps) and mixed-signal instruments for video and audio testing. Initial Sapphire D production test systems have been shipped, installed and accepted.