Description
TEST SORTConfiguration
8 sites, 48 I/O per siteOEM Model Description
Introduced in fiscal 1999, the Kalos (hex) is based upon the Kalos tester. The Kalos (hex) features 16 test sites, enabling testing of high pin count NVM and flash memory core microcontroller devices.Documents
No documents
COHU / LTX-CREDENCE
KALOS hex
Verified
CATEGORY
Final Test
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
16110
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
KALOS hex
CATEGORY
Final Test
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
16110
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
TEST SORTConfiguration
8 sites, 48 I/O per siteOEM Model Description
Introduced in fiscal 1999, the Kalos (hex) is based upon the Kalos tester. The Kalos (hex) features 16 test sites, enabling testing of high pin count NVM and flash memory core microcontroller devices.Documents
No documents