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D10 TESTERS AVAILABLE -DPIN-16M*6/7/8.DPS16.DIBU -DPIN-32M*3/4/5/6,DPS16*1/2,VIS16,DIBU -DPIN-32M*2/4/5,DPIN-64M*1/4,DPS16*1/2,VIS16,DIBU -DPIN-64M*5,DPS16,VIS16,DIBUOEM Model Description
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.Documents
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COHU / LTX-CREDENCE
DIAMOND 10
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
79393
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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View AllCOHU / LTX-CREDENCE
DIAMOND 10
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
79393
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
D10 TESTERS AVAILABLE -DPIN-16M*6/7/8.DPS16.DIBU -DPIN-32M*3/4/5/6,DPS16*1/2,VIS16,DIBU -DPIN-32M*2/4/5,DPIN-64M*1/4,DPS16*1/2,VIS16,DIBU -DPIN-64M*5,DPS16,VIS16,DIBUOEM Model Description
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.Documents
No documents