Description
Keysight Medalist i3070 Series 5 2-Module In-Circuit Test System, p/n E9902E (TH E9998E), 12MHz advanced combinational, 100-415V, 50/60Hz, 3ph, w/ enabled features: simple express fixturing, incircuit test, functional test, timing test, boundary-scan, advanced boundary-scan, advanced boundary-scan differential, advanced I/O boundary scan, PanelTest, throughput multiplier, testjet, polarity check, connect check, powered testing, software revision B, fault detective, Flash70, awaretest, control XT override, advanced fixturing, silicon nails, flash ISP, PLD ISP, external application DLL. Module 4 config: 64Mb RAM, 1x NASRU, 8x HAdvDD2, 1x CtlXtpA, 1x Access.Configuration
No ConfigurationOEM Model Description
Medalist i3070 Series 5 In-Circuit Test System The Medalist i3070 Series 5 Board Test Family is the broadest and most compatible family of board test systems available on the market today . Designed to handle a wide variety of test strategies, technologies, printed circuit boards (PCBs), and budgets, the Medalist i3070 Series 5 family offers a specific test system to fit your exact requirements. The systems can be expanded in both hardware and software capabilities to meet future growth needsDocuments
No documents
CATEGORY
Final Test
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137026
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
i3070 SERIES 5
CATEGORY
Final Test
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
137026
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Keysight Medalist i3070 Series 5 2-Module In-Circuit Test System, p/n E9902E (TH E9998E), 12MHz advanced combinational, 100-415V, 50/60Hz, 3ph, w/ enabled features: simple express fixturing, incircuit test, functional test, timing test, boundary-scan, advanced boundary-scan, advanced boundary-scan differential, advanced I/O boundary scan, PanelTest, throughput multiplier, testjet, polarity check, connect check, powered testing, software revision B, fault detective, Flash70, awaretest, control XT override, advanced fixturing, silicon nails, flash ISP, PLD ISP, external application DLL. Module 4 config: 64Mb RAM, 1x NASRU, 8x HAdvDD2, 1x CtlXtpA, 1x Access.Configuration
No ConfigurationOEM Model Description
Medalist i3070 Series 5 In-Circuit Test System The Medalist i3070 Series 5 Board Test Family is the broadest and most compatible family of board test systems available on the market today . Designed to handle a wide variety of test strategies, technologies, printed circuit boards (PCBs), and budgets, the Medalist i3070 Series 5 family offers a specific test system to fit your exact requirements. The systems can be expanded in both hardware and software capabilities to meet future growth needsDocuments
No documents