Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits.

AEHR TEST SYSTEMS

The MTX massively parallel test system is designed to reduce the cost of memory testing by processing thousands of memory devices simultaneously, including DRAMs, flash memories, SDRAMs, DDR SDRAMs, DDR II SDRAMs, and SRAMs. The MTX system can perform a significant number of tests usually performed by traditional memory testers, including pattern sensitivity tests, functional tests, data retention tests and refresh tests.

AEHR TEST SYSTEMS

MTX

Final Test

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MTX

Final Test

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