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SEMILAB SE-3000
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    Documents
    File icon

    SOPRA frame SE300.pdf

    SEMILAB

    SE-3000

    verified-listing-icon

    Verified

    CATEGORY
    Elipsometry

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    84893

    Wafer Sizes:

    12"/300mm

    Vintage:

    2004

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    SEMILAB SE-3000

    SEMILAB

    SE-3000

    Elipsometry
    Vintage: 2004Condition: Used
    Last VerifiedOver 60 days ago

    SEMILAB

    SE-3000

    verified-listing-icon
    Verified
    CATEGORY
    Elipsometry
    Last Verified: Over 60 days ago
    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg
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    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg
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    listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    84893

    Wafer Sizes:

    12"/300mm

    Vintage:

    2004

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity
    Documents
    File icon

    SOPRA frame SE300.pdf

    Similar Listings
    View All
    SEMILAB SE-3000

    SEMILAB

    SE-3000

    ElipsometryVintage: 2004Condition: UsedLast Verified: Over 60 days ago