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ONTO / RUDOLPH / AUGUST FOCUS FE III
    Description
    MET
    Configuration
    No Configuration
    OEM Model Description
    FOCUS FE III system provides a low cost 100 to 200 millimeters automated ellipsometer using our dual wavelength Focused Beam technology. It directly measures sample wafers with a small spot at multiple angles of incidence.
    Documents

    No documents

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    verified-listing-icon

    Verified

    CATEGORY
    Elipsometry

    Last Verified: 15 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    75936

    Wafer Sizes:

    8"/200mm

    Vintage:

    1991

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST FOCUS FE III

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    Elipsometry
    Vintage: 1991Condition: Used
    Last Verified15 days ago
    ONTO / RUDOLPH / AUGUST FOCUS FE III

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    Elipsometry
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    verified-listing-icon
    Verified
    CATEGORY
    Elipsometry
    Last Verified: 15 days ago
    listing-photo-e5eb06f31f9f4960b83ef6aa060e0a6c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    75936

    Wafer Sizes:

    8"/200mm

    Vintage:

    1991

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    MET
    Configuration
    No Configuration
    OEM Model Description
    FOCUS FE III system provides a low cost 100 to 200 millimeters automated ellipsometer using our dual wavelength Focused Beam technology. It directly measures sample wafers with a small spot at multiple angles of incidence.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST FOCUS FE III

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    ElipsometryVintage: 1991Condition: UsedLast Verified:15 days ago
    ONTO / RUDOLPH / AUGUST FOCUS FE III

    ONTO / RUDOLPH / AUGUST

    FOCUS FE III

    ElipsometryVintage: 0Condition: UsedLast Verified:Over 60 days ago