Description

Yokogawa/Ando AQ6317B Optical Spectrum Analyzer 600-1750 nm, SM, GI (50/125 µm) Features: -High wavelength accuracy - Provides ±0.02 nm wavelength accuracy at 1520 or 1580 nm, and ±0.04 nm at 1580 to 1620 nm, with ±0.01 nm wavelength linearity, making it especially useful for high-precision loss wavelength characteristics and other evaluation of WDM devices. The horizontal axis corresponds to air wavelength, vacuum wavelength and frequency. -High wavelength resolution - Achieves a wavelength resolution of 0.015 nm. -Wide dynamic range for 50 GHz WDM signals - The dynamic range is 70 dB at peak ±0.4 nm, and 0 dB at peak ±0.2 nm. High-resolution measurement achieves wide dynamic range with 50 GHz spacing WDM system. -Versatile analysis functions - Analysis functions for WDM and other optical devices (LD, LED, FBG, etc.). -Synchronous sweep - In conjunction with an AQ4321A/D (not included) Tunable Laser Source, much higher wavelength resolution/wide dynamic range can be achieved by high-speed synchronous sweep (Max. speed: 10 nm/1 sec). -Wide band, high sensitivity and high power measurement - -90 to +20 dBm (1200 to 1600 nm), -80 to +20 dBm (1600 to 1700 nm). High sensitivity allows measurement of light at down to -90 dBm, covering from 1200 to 1600 nm. Optical amplifiers and high-powered laser diodes can be measured directly because measurement of up to +20 dBm per one resolution is possible. -Low polarization dependency - Measurements such as optical amplifier gain can proceed with accuracy because polarization dependency is suppressed as low as ±0.05 dB. -High-level accuracy - Accurate within ±0.3 dB. -9.4-inch color LCD -Pulse light can be measured -Three individual trace memories Applications: -WDM signal analysis -Optical fiber amplifier (EDFA) evaluation -Characteristic evaluation of optical passive devices -Characteristic evaluation of optical multiplexer (OMUX) using synchronous sweep -Various parameter evaluations of LED, FP-LD and DFB-LD -Programming function -Long-term function Description: The AQ6317B is an advanced optical spectrum analyzer for a wide range of applications, including light source evaluation, measurement of loss wavelength characteristics in optical devices, and waveform analysis of WDM systems. Especially at C and L band, the unit achieves high wavelength accuracy and wavelength linearity, and can evaluate optical deices for WDM. Analysis functions make operation and expandability simple. In comparison with the former model, the wavelength accuracy of the AQ6317B has been improved to ±20 pm, and this is also specified for the L-band. The WDM analysis function and notch width analysis function have been improved, and a multi-channel NF analysis function and optical filter analysis function are new additions. It has become much easier to use owing to other improvements such as sweep speed-up. The AQ6317B contains the latest Ando technology for optical spectrum analyzers - reference equipment for the next generation.

Configuration

The Unit's Serial Number Tag Reads: Serial Number: 10201897

OEM Model Description

The AQ6317B is an advanced optical spectrum analyzer that is designed for a wide range of applications. It can be used to evaluate light sources, measure the loss wavelength characteristics of optical devices, and analyze the waveforms of WDM (Wavelength Division Multiplexing) systems. The unit is particularly effective at the C-band and L-band, where it achieves high levels of wavelength accuracy and linearity. This makes it ideal for evaluating optical devices used in WDM systems.