Description
CURVE TRACERConfiguration
No ConfigurationOEM Model Description
The Tektronix 576 is a versatile curve-tracing system that excels in high-current testing applications. It can display curves for a wide range of semiconductors, including bipolar transistors, field-effect transistors, silicon-controlled rectifiers, triacs, diacs, diodes and rectifiers, zener diodes, and tunnel diodes. The system is capable of pulse collector operation up to 200 amps peak and has a voltage range of 15 V to 1500 V. The collector supply can provide up to 220 W peak and the step generator has adjustable current limiting. A display area readout of test results and setup parameters helps reduce the likelihood of operator error.Documents
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TEKTRONIX
576
Verified
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
112840
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
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TEKTRONIX
576
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
112840
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
CURVE TRACERConfiguration
No ConfigurationOEM Model Description
The Tektronix 576 is a versatile curve-tracing system that excels in high-current testing applications. It can display curves for a wide range of semiconductors, including bipolar transistors, field-effect transistors, silicon-controlled rectifiers, triacs, diacs, diodes and rectifiers, zener diodes, and tunnel diodes. The system is capable of pulse collector operation up to 200 amps peak and has a voltage range of 15 V to 1500 V. The collector supply can provide up to 220 W peak and the step generator has adjustable current limiting. A display area readout of test results and setup parameters helps reduce the likelihood of operator error.Documents
No documents