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The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.Documents
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
Verified
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
88262
Wafer Sizes:
Unknown
Vintage:
Unknown
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
88262
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.Documents
No documents