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Description
Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller-all in one instrument. Contact check function ensures high integrity measurements 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times. Family of products offers wide dynamic range: 1pA to 10A and 1µV to 200V. The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications. TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 Source Meter channels into a system that can be programmed and controlled as a single instrument. Dual Channel System that can source up to 200V.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84339
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KEITHLEY
2612
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84339
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller-all in one instrument. Contact check function ensures high integrity measurements 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times. Family of products offers wide dynamic range: 1pA to 10A and 1µV to 200V. The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications. TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 Source Meter channels into a system that can be programmed and controlled as a single instrument. Dual Channel System that can source up to 200V.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents