Description
The 2600A System SourceMeter instruments are suitable as either bench-top I-V characterization tools or as building block components of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP Express Software Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, the Series 2600A's Test Script Processor (TSP) architecture, along with other new capabilities such as parallel test execution and precision timing, provides the highest throughput in the industry, lowering the cost of test.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
KEITHLEY
2601A
Verified
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84334
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
KEITHLEY
2601A
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84334
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
The 2600A System SourceMeter instruments are suitable as either bench-top I-V characterization tools or as building block components of multi-channel I-V test systems. For bench-top use, Series 2600A instruments feature an embedded TSP Express Software Tool that allows users to quickly and easily perform common I-V tests without programming or installing software. For system level applications, the Series 2600A's Test Script Processor (TSP) architecture, along with other new capabilities such as parallel test execution and precision timing, provides the highest throughput in the industry, lowering the cost of test.Configuration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents