Description
Chroma Prober 58173-FCConfiguration
No ConfigurationOEM Model Description
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.Documents
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CHROMA
58173
CATEGORY
Electronic Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
135856
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Chroma Prober 58173-FCConfiguration
No ConfigurationOEM Model Description
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.Documents
No documents