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HSEB / ZEISS ODIN-A30
    Description
    Metrology / inspection system
    Configuration
    Meas System Automated Wafer Handling (Qty 2) FOUP Factory Interface Process: Wafer Inspection Tool Software Version: TC*1.15.5/10.2.00 CIM: SECS/GEM
    OEM Model Description
    None Provided
    Documents

    No documents

    HSEB / ZEISS

    ODIN-A30

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 6 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    154827

    Wafer Sizes:

    12"/300mm

    Vintage:

    2012

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    HSEB / ZEISS ODIN-A30

    HSEB / ZEISS

    ODIN-A30

    Defect Inspection
    Vintage: 2012Condition: Used
    Last Verified6 days ago

    HSEB / ZEISS

    ODIN-A30

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 6 days ago
    listing-photo-6c35c000cbdb4583a4c85027a69fd406-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    154827

    Wafer Sizes:

    12"/300mm

    Vintage:

    2012

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Metrology / inspection system
    Configuration
    Meas System Automated Wafer Handling (Qty 2) FOUP Factory Interface Process: Wafer Inspection Tool Software Version: TC*1.15.5/10.2.00 CIM: SECS/GEM
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    HSEB / ZEISS ODIN-A30

    HSEB / ZEISS

    ODIN-A30

    Defect InspectionVintage: 2012Condition: UsedLast Verified:6 days ago