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OLYMPUS FR3200
    Description
    Industrial-grade semiconductor wafer inspection microscope system
    Configuration
    No Configuration
    OEM Model Description
    None Provided
    Documents

    No documents

    OLYMPUS

    FR3200

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 5 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    148289

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    OLYMPUS FR3200

    OLYMPUS

    FR3200

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified5 days ago
    OLYMPUS FR3200

    OLYMPUS

    FR3200

    Defect Inspection
    Vintage: 2002Condition: Used
    Last VerifiedOver 60 days ago

    OLYMPUS

    FR3200

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 5 days ago
    listing-photo-33e40f95580049d88af413eee8fe5c36-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74716/33e40f95580049d88af413eee8fe5c36/6f108fa8e8c5401f9c8c954996ee04c1_0e4e9e14d58e4300a424a748e6c0821345005c_mw.jpeg
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    listing-photo-33e40f95580049d88af413eee8fe5c36-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74716/33e40f95580049d88af413eee8fe5c36/5ba2fb3928194dab95b36622a432106b_6b602488b6504d36bf661d387bd89210_mw.jpeg
    listing-photo-33e40f95580049d88af413eee8fe5c36-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74716/33e40f95580049d88af413eee8fe5c36/057c1c84f09a4c87b730953c2f3b4b20_993c65aeff7a4587b9fea56915723d6b_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    148289

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Industrial-grade semiconductor wafer inspection microscope system
    Configuration
    No Configuration
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    OLYMPUS FR3200

    OLYMPUS

    FR3200

    Defect InspectionVintage: 0Condition: UsedLast Verified:5 days ago
    OLYMPUS FR3200

    OLYMPUS

    FR3200

    Defect InspectionVintage: 2002Condition: UsedLast Verified:Over 60 days ago