Description
Automation Microscope HDD is includedConfiguration
Microscope (micro) inspection Total magnification 5x to 150x Inspection modes Brightfield, Darkfield, Macro inspection Surface Macro, center backside Macro, perimeter backside Macro Load port 2 FOUP Position selectable from side or rear Wafer transfer Robotic handling; vacuum chuck; noncontact pre-alignment mechanism Operation mouse, keyboardOEM Model Description
OPTISTATION-3200 wafer inspection systemDocuments
No documents
NIKON
OPTISTATION-3200
Verified
CATEGORY
Defect Inspection
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
118716
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
OPTISTATION-3200
CATEGORY
Defect Inspection
Last Verified: 2 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
118716
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Automation Microscope HDD is includedConfiguration
Microscope (micro) inspection Total magnification 5x to 150x Inspection modes Brightfield, Darkfield, Macro inspection Surface Macro, center backside Macro, perimeter backside Macro Load port 2 FOUP Position selectable from side or rear Wafer transfer Robotic handling; vacuum chuck; noncontact pre-alignment mechanism Operation mouse, keyboardOEM Model Description
OPTISTATION-3200 wafer inspection systemDocuments
No documents