Description
No descriptionConfiguration
Specification: Wafer Size: 300mm (200mm compatible) Objective Magnification: 2.5x / 10x / 20x / 50x / 100x / 150x Inspection Modes: Brightfield (BF), Darkfield (DF) Macro Inspection: Surface Macro, Center Backside Macro, Perimeter Backside Macro Load Port: 2 FOUP (Side or Rear selectable) Wafer Transfer: Robotic handling, Vacuum chuck, Non-contact pre-alignment Peripherals: HDD included, Mouse & KeyboardOEM Model Description
OPTISTATION-3200 wafer inspection systemDocuments
No documents
Verified
CATEGORY
Defect Inspection
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
142259
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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NIKON
OPTISTATION-3200
CATEGORY
Defect Inspection
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
142259
Wafer Sizes:
8"/200mm, 12"/300mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Specification: Wafer Size: 300mm (200mm compatible) Objective Magnification: 2.5x / 10x / 20x / 50x / 100x / 150x Inspection Modes: Brightfield (BF), Darkfield (DF) Macro Inspection: Surface Macro, Center Backside Macro, Perimeter Backside Macro Load Port: 2 FOUP (Side or Rear selectable) Wafer Transfer: Robotic handling, Vacuum chuck, Non-contact pre-alignment Peripherals: HDD included, Mouse & KeyboardOEM Model Description
OPTISTATION-3200 wafer inspection systemDocuments
No documents