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KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
  • KLA VIPER 2430
Description
MET
Configuration
Defect Inspection
OEM Model Description
In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
Documents

No documents

CATEGORY
Defect Inspection

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

70666


Wafer Sizes:

12"/300mm


Vintage:

2004


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

VIPER 2430

verified-listing-icon
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
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Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

70666


Wafer Sizes:

12"/300mm


Vintage:

2004


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
MET
Configuration
Defect Inspection
OEM Model Description
In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
Documents

No documents