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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA VIPER 2430
    Description
    MET
    Configuration
    Defect Inspection
    OEM Model Description
    In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
    Documents

    No documents

    KLA

    VIPER 2430

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 15 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    70666


    Wafer Sizes:

    12"/300mm


    Vintage:

    2004


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA VIPER 2430

    KLA

    VIPER 2430

    Defect Inspection
    Vintage: 2004Condition: Used
    Last Verified15 days ago

    KLA

    VIPER 2430

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 15 days ago
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    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    70666


    Wafer Sizes:

    12"/300mm


    Vintage:

    2004


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    MET
    Configuration
    Defect Inspection
    OEM Model Description
    In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
    Documents

    No documents

    Similar Listings
    View All
    KLA VIPER 2430

    KLA

    VIPER 2430

    Defect InspectionVintage: 2004Condition: UsedLast Verified:15 days ago