The KLA 2020 is die older-generation model, which has both inspection and critical-dimension measurement (CD) capability. CD is the measurement of the circuit and line dimensions on the wafer, which are typically on the order of one micron or less.

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

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