Description
No descriptionConfiguration
No ConfigurationOEM Model Description
LS-5270 particle detection system, 30 wafers per hour, can detect particles on rough films, like CVD tungsten.Documents
No documents
HITACHI
LS-5270
CATEGORY
Defect Inspection
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
139481
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
LS-5270 particle detection system, 30 wafers per hour, can detect particles on rough films, like CVD tungsten.Documents
No documents